Loading...
Derniers dépôts
Rechercher
Nombre de documents
77
Nombre de notices
277
Mots-clés
Scanning electron microscopy
TEM
CHLORINE PLASMAS
Colloidal solution
Transfert d'énergie
CIGSe
Structure
Low-pressure plasma processing
Atomic layer etching
AZO thin films
Band gap
Resistive switching
TiO2
C Photoelectron spectroscopy
A Multilayers
SF 6
Chalcogenide glass
Ablation laser
PECVD
Chemical and biological sensors
Physical vapor deposition
Residual stress
Thin films
X-ray photoelectron spectroscopy
Anatase
A3 Physical vapor deposition processes
Aluminium nitride
Thin film
A Chalcogenides
Carbon Nanotube
Argon InP chlorine etching inductive coupled plasma ICP modeling plasma sheath simulation
Films
BOMBARDMENT
Biofilms microbiens
Spectroscopic ellipsometry
Plasmas froids
AuCu alloy
A-CNx
Band alignment
Nanotubes
Biocapteurs
Magnetron sputtering
CaTiO3Pr^3^+
A1 Characterization
Ambipolar material
Carbon nitride
Functionalization
Nanocomposite
Oxides
CNTs’ collapse
Sol-gel
Transmission electron microscopy
Cathepsin
Alzheimer's disease
Atomic force microscopy
Mott insulators
Biomasse
B3 Solar cells
B2 Quaternary
XPS
Selenization
Kirkendall effect
Sputtering
Semiconductors
AlN
Carbon
Bixbyite
Adsorption
Plasma etching
B1 Inorganic compounds
Capacitance
Avalanche breakdown
X-ray diffraction
Bipolar resistive switching BRS
Chalcogenides
Vanadium Sesquioxide
Aryl-diazonium salts
Non-volatile memory
Amorphous
Calcined clay
Applications industrielles
Chemical detection
Alloying
3 nm in size
Titanium dioxide
Optical properties
Amyloid precursor
NEXAFS
B2 Semiconducting indium compounds
Carbon nanotubes
V2O3
CH4
Copper
B2 Semiconducting alloys
Buffer Couple
Etching
A Thin films
B Chemical synthesis
Mott insulator
Chalcogenide